CVE-2024-53017

Memory corruption while handling test pattern generator IOCTL command.

Score

CVSS 3.1 6.6 Medium

Status

Analyzed - product-security@qualcomm.com

Published

2025-06-03

Last modified

2025-06-03

Weaknesses

CWE-823

Affected products

• Sdm429w Firmware (Qualcomm)
• Snapdragon 429 Mobile Platform Firmware (Qualcomm)
• Wcn3620 Firmware (Qualcomm)
• Wcn3660b Firmware (Qualcomm)
• Snapdragon (Qualcomm Inc.)

References

• https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html