CVE-2022-25696

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

Score
CVSS 3.1 8.4 High
Status
Modified - product-security@qualcomm.com
Published
2022-09-16
Last modified
2024-08-03
Weaknesses
CWE-367

Affected products

References